Material Characterisation & Fabrication

IPAS - Analytical Facility

We have the following instruments for material characterisations and syntheses. These instruments are not just accessible to IPAS members but also for external users.

For bookings and costs please contact:

Alson Ng - dry measure equipment

Alternatively, please contact Luis Lima-Marques for general enquiries.

Dry measure analytical equipment

For information regarding equipment listed below, please contact Alson Ng.

Simultaneous thermal analyser (STA)

Brand and Model

Netzsch STA449 F3 Jupiter + QMS403 Aeolos® Quadro

Specifications

SiC furnace with temperature range from 25°C to 1600°C

Balance digital resolution 0.1ug

Sample purge gases: Nitrogen, Oxygen or Air

Applications

STA simultaneously combines differential thermal analysis (DSC and DTA) with thermo-gravimetric analysis (TGA). STA is commonly used for measuring melting/crystalisation temperature, reaction enthalpies, quantity of volatile content in materials and thermal stabilities

Option

Quadrupole Mass Spectrometer (QMS) 403 Aeolos® Quadro coupling for routine analysis of gases and products of thermal analysis

Mass spectrometer mass 1-300amu

Heated capillary inlet system and transfer line max temp 300oC

Fourier transform infrared spectrophotometer (FTIR)

Brand and Model

Perkin Elmer Spectrum 400

Specifications

Optimum Wavelength range: 7800 to 400 cm-1 (TGS)

7800 to 450 cm-1(MCT)

Detectors

Triglycine sulphate (TGS)

Mercury cadmium telluride (MCT)

This instrument can be purged with nitrogen.

Accessories

Universal attenuated total reflectance (UATR) module with standard

Diamond/ZnSe. Ge crystal is also available.

Variable angle specular reflectance accessory

UV-Vis-NIR spectrophotometer

Brand and Model

Agilent Cary 5000

Specifications

Wavelength range 175 to 3300 nm

Accessories

Solid samples holder

Cuvettes holder

Variable Angle Specular Reflectance Accessory

3D optical microscope (optical profiler)

Brand and Model

Bruker Contour GT-K

Specifications

Maximum scan range: up to 10 mm

Vertical resolution: less than 0.01 nm

Applications

This instrument performs non-contact 3D surface metrology measurements.

Infrared variable angle spectroscopic ellipsometer

Brand and Model

J.A. Woollam IR-VASE

Specification

1.7 to 30 μm (333 to 5900 wavenumbers)

Application

Common measurements include coating thickness, IR refractive indices and molecular bond vibrations.

Precision analytical balance

Brand and Model

XS205 Mettler Tolendo

Specifications

Maximum capacity: 81/220g

Readability: 0.01 mg/ 0.1 mg

Accessories

Density measurement

Pipette calibration

Wet measure analytical equipment

Analytical high performance liquid chromatography (HPLC)

Brand and Model

Agilent Technologies 1260 Infinity

Key features

This HPLC is fitted with an automatic sampler.

The detection mode is based on UV-Vis absorption.

The approximate wavelengths are between 215 - 360 nm.

Plate reader

Brand and Model

Synergy H4

Specifications

Detection modes include fluorescence Intensity, luminescence and UV/Vis absorbance.

System has both top and bottom probes for fluorescence measurements.

This system supports a reading of 6, 12, 24, 48, 96 well microplates.

Microwave peptide synthesizer

Brand and Model

CEM liberty 1

Key features

It is a fully automated system for the synthesis of peptides. It allows the use of microwave energy for both coupling and deprotection steps. This instrument also allows programmable cleavage and automated resin addition.

Microwave synthesizer for general organic synthesis

Brand and Model

CEM Discover and explorer SP

Specification

Operating volume:

0.2 – 7 ml (10 ml pressure vial)

2 – 25 ml (35 ml pressure vial)

15 – 50 ml (80 ml pressure vial)

Open vessel 5 – 125 ml round bottom flask (ambient pressure)

Power: 300 W (maximum)

Temperature: 40 – 300°C

This instrument is fitted with compressed air cooling system